納米技術中的顯微學手冊.第1卷

內容概要

現(xiàn)代顯微學在納米技術領域的研究和發(fā)展中起到“眼睛”和“手”的功能。迄今，人們仍在孜孜不倦地尋找納米尺度上的“火眼金睛”。本手冊的目的在于提供關于各種顯微學的原理及其在該迅猛發(fā)展的領域內應用的綜述參考書。本手冊共有22個專題，每一專題都由不同研究領域的、處于世界前沿的科學家撰寫。本書是第1卷，涵蓋的范圍包括共聚焦光學顯微鏡、掃描近場光學顯微鏡、各種掃描探針顯微術、離子顯微鏡等，共有10個專題。本書力圖使讀者對所敘述的方法有一個概念上的理解，而不是只停留在對理論的堆砌上。在每一個專題里，都會敘述相關的實例及其應用并加以討論，使讀者對每種顯微技術都能明了和理解；還會進一步展示各章之間的內在聯(lián)系，表明每一種技術如何在綜合性的、復雜的測試中各自扮演獨特的角色，解決具體的問題。

書籍目錄

1 Confocal Scanning Optical Microscopy and Nanotechnology　1.1 Introduction　1.2 The Confocal Microscope　　1.2.1 Principles of Confocal Microscopy　　1.2.2 Instrumentation　　1.2.3 Techniques for Improving Imaging of Nanoscale Materials　1.3 Applications to Nanotechnology　　1.3.1 Three Dimensional Systems　　1.3.2 Two Dimensional Systems　　1.3.3 One Dimensional Systems　　1.3.4 Zero Dimensional Systems　1.4 Summary and Future PerspectivesReferences　2 Scanning Near Field Optical Microscopy in Nanosciences　　2.1 Scanning Near Field Optical Microscopy and Nanotechnology　　2.2 Basic Concepts　2.3 Instrumentation　　2.3.1 Probe Fabrication　　2.3.2 Flexibility of Near Field Measurements　2.4 Applications in Nanoscience　　2.4.1 Fluorescence Microscopy　　2.4.2 Raman Microscopy　　2.4.3 Plasmonic and Photonic Nanostructures　　2.4.4 Nanolithography　　2.4.5 Semiconductors　2.5 Perspectives　References3 Scanning Tunneling Microscopy　3.1 Basic Principles of Scanning Tunneling Microscopy　　3.1.1 Electronic Tunneling　　3.1.2 Scanning Tunneling Microscope　3.2 Surface Structure Determination by Scanning Tunneling Microscopy　　3.2.1 Semiconductor Surfaces　　3.2.2 Metal Surfaces　　3.2.3 Insulator Surfaces　　3.2.4 Nanotubes and Nanowires　　3.2.5 Surface and Subsurface Dynamic Processes　3.3 Scanning Tunneling Spectroscopies　　3.3.1 Scanning Tunneling Spectroscopy　　3.3.2 Inelastic Tunneling Spectroscopy　　3.3.3 Local Work Function Measurement　3.4 STM Based Atomic Manipulation　　3.4.1 Manipulation of Single atoms　　3.4.2 STM Induced Chemical Reaction at Tip　3.5 Recent Developments 　　3.5.1 Spin Polarized STM　　3.5.2 Ultra Low Temperature STM　　3.5.3 Dual Tip STM　　3.5.4 Variable Temperature Fast Scanning STM　References4 Visualization of Nanostructures with Atomic Force Microscopy　4.1 Introductory Remarks　4.2 Basics of Atomic Force Microscopy　　4.2.1 Main Principle and Components of Atomic Force Microscope　　4.2.2 Operational Modes, Optimization of the Experiment and Image Resolution　　4.2.3 Imaging in Various Environments and at Different Temperatures　4.3 Imaging of Macromolecules and Their Self Assemblies　　4.3.1 Visualization of Single Polymer Chains　　4.3.2 Alkanes, Polyethylene and Fluoroalkanes　4.4 Studies of Heterogeneous Systems　　4.4.1 Semicrystalline Polymers　　4.4.2 Block Copolymers　　4.4.3 Polymer Blends and Nanocomposites　4.5 Concluding Remarks　References5 Scanning Probe Microscopy for Nanoscale Manipulation and Patterning　5.1 Introduction　　5.1.1 Nanoscale Toolbox for Nanotechnologists……6 Scanning Thermal and Thermoelectric Microscopy7 Imaging Secondary Ion Mass Spectrometry8 Atom Probe Tomography9 Focused Ion Beam System—a Multifunctional Tool for Nanotechnology10 Electron Beam LithographyIndex

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