微觀組織的分析電子顯微學(xué)表征

內(nèi)容概要

　　本收系統(tǒng)地介紹了分析電子顯微學(xué)（AEM）的基本概念和操作技術(shù)，聚集于相戀和形變中位錯(cuò)的AEM研究。同時(shí)通過大量的例子闡述衍射晶體學(xué)的物理概念和數(shù)學(xué)分析方法，例如相變中位向關(guān)系的定量預(yù)測(cè)等，以便讀者加深理解和拓展視野。

書籍目錄

Chapter 1　Analytical Electron Microscope (AEM)
　1.1　Brief introduction of AEM history
　1.2　Interaction between electrons and specimen and signals used by
AEM
　1.3　Electron wavelength and electromagnetic lens
　　1.3.1　Electron wavelength
　　1.3.2　Electromagnetic lens
　1.4　Structure and function of AEM
　　1.4.1　Illumination system
　　1.4.2　Specimen holders
　　1.4.3　Imaging system
　　1.4.4　Image recording
　　1.4.5　Power supply system and vacuum system
　　1.4.6　Computer control　'
　1.5　The principle of imaging, magnifying and diffracting
　1.6　Theoretical resolution limit
　1.7　Depth of focus and depth of field
　1.8　Spherical aberration-c0rrected TEMs　References　
Chapter 2　Specimen Preparation
　2.1　Traditional techniques
　　2.1.1　Replica
　　2.1.2　Preparation of powders
　　2.1.3　Film preparation for plan view
　　2.1.4　Film preparation from a bulk metallic sample .
　　2.1.5　Film preparation from a bulk nonmetaltic sample.
　2.2　Special techniques　
　　2.2.1　Cross-sectional specimen preparation
　　2.2.2　Cleaving and small angle cleavage technique
　　2.2.3　Ultramicrotomy
　　2.2.4　Focused ion beam technique　References
Chapter 3　Electron Diffraction
　3.1　Comparison of electron diffraction with X-ray
diffraction
　3.2　Conditions of diffraction
　　3.2.1　Geometric condition
　　3.2.2　Physical condition
　　3.2.3　Diffraction deviating from exact Bragg Condition
　3.3　Basic equation used for analysis of electron diffraction
pattern
　 3.3.1　Diffraction in an electron diffractometer
　 3.3.2　Diffraction in a TEM
　3.4　Principle and operation of selected area electron
diffraction
　3.5　Rotation of image relative to diffraction pattern
　3.6　Diffraction patterns of polycrystal and their
applications
　　3.6.1　Formation and geometric features of diffraction patterns
for polycrystal
　　3.6.2　Applications of ring patterns
　3.7　Geometric features of diffraction patterns of single
crystals
　　3.7.1　Geometric features and diffraction intensity of a single
crystal pattern
　　3.7.2　Indexing methods of single crystal diffraction
patterns　
　3.8　Main applications of single crystal pattern
　　3.8.1　Identification of phases
　　3.8.2　Determination of orientation relationship
　3.9　Diffraction spot shift by stacking faults and determination of
stacking fault probability
　　3.9.1　Diffraction from planar defect
　　3.9.2　Determination of stacking fault probability in HCP
crystal
　　3.9.3　Determination of stacking fault probability in FCC
crystal
　3.10　Systematic tilting technique and its applications
　　3.10.1　Systematic tilting technique by double tilt holder.
　　3.10.2　Determination of electron beam direction
　……
Chapter 4 Mathematics Analysis in Electron Diffraction and
Crystallography
Chapter 5 Diffraction Contrast
Chapter 6 high Resolution and High Spatial Resolution of Analytica
electron Microscopy
Appendix
Index

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